Static information storage and retrieval – Systems using particular element – Semiconductive
Reexamination Certificate
2009-12-18
2011-10-11
Nguyen, Viet (Department: 2827)
Static information storage and retrieval
Systems using particular element
Semiconductive
C365S185180, C257S288000
Reexamination Certificate
active
08036027
ABSTRACT:
A memory applicable to an embedded memory is provided. The memory includes a substrate, a gate, a charge-trapping gate dielectric layer, a source, and a drain. The gate is disposed above the substrate. The charge-trapping gate dielectric layer is disposed between the gate and the substrate. The source and the drain are disposed in the substrate beside the gate respectively.
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Chinese Examination Report of Taiwan Patent Application No. 096102275, dated Mar. 29, 2010.
J.C. Patents
MACRONIX International Co. Ltd.
Nguyen Viet
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