Semiconductor device and manufacturing method thereof, and...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having schottky gate

Reexamination Certificate

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C257SE21014

Reexamination Certificate

active

11022987

ABSTRACT:
A method for manufacturing a semiconductor device includes a step of forming a layer where a gate electrode aperture is to be formed including at least one ultraviolet resist layer on the surface where a gate electrode is to be formed, and forming a gate electrode aperture in the layer where a gate electrode aperture is to be formed; a step of forming a layer where an over-gate is to be formed in which an over-gate part of a gate electrode is to be formed, on the layer where a gate electrode aperture is to be formed; a step of reducing the width of the gate electrode aperture; and a step of forming the gate electrode in the gate electrode aperture. The method makes it possible to efficiently produce a fine gate electrode by thickening the gate electrode aperture and reducing the width of the gate electrode aperture.

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Takeo Ishibashi et al.; The Japan Society of Applied Physics, vol. 40, Part 1, No. 1, pp. 419-425, Jan. 2001.
Mamoru Terai et al.; Advanced Technology R&D Center, Proceedings of SPIE, vol. 5039, pp. 789-797, 2003.

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