Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into...
Reexamination Certificate
2005-06-20
2011-12-27
Smith, Bradley K (Department: 2894)
Semiconductor device manufacturing: process
Introduction of conductivity modifying dopant into...
C438S795000
Reexamination Certificate
active
08084338
ABSTRACT:
The depletion of a gate electrode (103) is suppressed in such a way that impurities are introduced into the gate electrode that is formed on a semiconductor substrate (101), with a gate insulating film (102) interposed between the gate electrode (103) and the semiconductor substrate (101), and that, by irradiating a laser beam onto the gate electrode (103), the introduced impurities are made to diffuse up to the interface between the gate electrode (103) and the gate insulating film (102).
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Okabe Ken-ichi
Yamamoto Tomonari
Fujitsu Semiconductor Limited
Smith Bradley K
Westerman Hattori Daniels & Adrian LLP
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