Semiconductor device and manufacturing method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S332000, C257S331000, C257S329000, C257S384000, C257SE29131, C257SE29257, C257SE29260

Reexamination Certificate

active

10947264

ABSTRACT:
An aspect of the present invention provides a semiconductor device that includes a first conductivity type semiconductor body, a source region in contact with the semiconductor body, whose bandgap is different from that of the semiconductor body, and which formed heterojunction with the semiconductor body, a gate insulating film in contact with a portion of junction between the source region and the semiconductor body, a gate electrode in contact with the gate insulating film, a source electrode, a low resistance region in contact with the source electrode and the source region, and connected ohmically with the source electrode, and a drain electrode connected ohmically with the semiconductor body.

REFERENCES:
patent: 4636823 (1987-01-01), Margalit et al.
patent: 5696396 (1997-12-01), Tokura et al.
patent: 6057558 (2000-05-01), Yamamoto et al.
patent: 6150693 (2000-11-01), Wollesen
patent: 6262439 (2001-07-01), Takeuchi et al.
patent: 6426248 (2002-07-01), Francis et al.
patent: 2005/0045892 (2005-03-01), Hayashi et al.
patent: 10-233503 (1998-09-01), None
patent: 2003-218398 (2003-07-01), None
patent: 2003-318398 (2003-11-01), None
Afanasev, V. V., et al., “Intrinsic SiC/SiO2Interface States” Phys. Stat. Sol. (A) 162, 321 (1997), pp. 321-337.

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