Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Reexamination Certificate
2006-01-03
2006-01-03
Barreca, Nicole (Department: 1756)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making electrical device
C430S313000, C430S315000, C430S935000
Reexamination Certificate
active
06982141
ABSTRACT:
A GaAs substrate200is rotated, a photosensitive silicone resist260is applied on a surface of the GaAs substrate200on which an aperture of a hole310to be a via hole, and an inside of the hole310to be the via hole is filled in with the photosensitive silicone resist260.Next, the GaAs substrate200is further rotated, changing the number of revolutions (rpm), and the photosensitive silicone resist260on the GaAs substrate is flattened. Next, a reverse side of the GaAs substrate is grinded, the hole310to be the via hole penetrates the GaAs substrate200from the surface to the reverse side and the via hole220is formed. Next, a reverse side electrode240is formed on the reverse side of the GaAs substrate200.Next, the GaAs sustrate200is divided chip by chip and chips are laid on a substrate for assembly270via an adhesive metal280.
REFERENCES:
patent: 4571322 (1986-02-01), Eichelberger et al.
patent: 6440846 (2002-08-01), Ikeya
patent: 2001-110897 (2001-04-01), None
Kuroishi Yoshitaka
Miyanaga Kazutsune
Murayama Keiichi
Nogome Masanobu
Tamura Akiyoshi
Barreca Nicole
Matsushita Electric - Industrial Co., Ltd.
Wenderoth , Lind & Ponack, L.L.P.
LandOfFree
Semiconductor device and manufacturing method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device and manufacturing method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and manufacturing method thereof will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3550998