Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2005-07-12
2005-07-12
Fourson, George (Department: 2823)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C438S520000, C438S528000
Reexamination Certificate
active
06916693
ABSTRACT:
In a crystallization process of an amorphous semiconductor film, a first crystalline semiconductor film having crystalline regions, and dotted with amorphous regions within the crystalline regions, is obtained by performing heat treatment processing after introducing a metallic element which promotes crystallization on the amorphous semiconductor film. The amorphous regions are kept within a predetermined range by regulating the heat treatment conditions at this point. Laser annealing is performed on the first crystalline semiconductor film, to form a second crystalline semiconductor film. Electrical characteristics for a TFT manufactured based on the second crystalline semiconductor film can be obtained having less dispersion.
REFERENCES:
patent: 5247190 (1993-09-01), Friend et al.
patent: 5399502 (1995-03-01), Friend et al.
patent: 5529937 (1996-06-01), Zhang et al.
patent: 5550070 (1996-08-01), Funai et al.
patent: 5643826 (1997-07-01), Ohtani et al.
patent: 5681759 (1997-10-01), Zhang
patent: 5830784 (1998-11-01), Zhang et al.
patent: 5879974 (1999-03-01), Yamazaki
patent: 5879977 (1999-03-01), Zhang et al.
patent: 5897347 (1999-04-01), Yamazaki et al.
patent: 5904770 (1999-05-01), Ohtani et al.
patent: 5923962 (1999-07-01), Ohtani et al.
patent: 5923966 (1999-07-01), Teramoto et al.
patent: 6066547 (2000-05-01), Maekawa
patent: 6071764 (2000-06-01), Zhang et al.
patent: 6077758 (2000-06-01), Zhang et al.
patent: 6088070 (2000-07-01), Ohtani et al.
patent: 6110770 (2000-08-01), Zhang et al.
patent: 6160279 (2000-12-01), Zhang et al.
patent: 6232156 (2001-05-01), Ohtani et al.
patent: 6285042 (2001-09-01), Ohtani et al.
patent: 6312979 (2001-11-01), Jang et al.
patent: 6326226 (2001-12-01), Jang et al.
patent: 6335541 (2002-01-01), Ohtani et al.
patent: 6417031 (2002-07-01), Ohtani et al.
patent: 6420246 (2002-07-01), Yamazaki et al.
patent: 6451638 (2002-09-01), Zhang et al.
patent: 6455401 (2002-09-01), Zhang et al.
patent: 6461899 (2002-10-01), Kitakado et al.
patent: 6465287 (2002-10-01), Yamazaki et al.
patent: 6482721 (2002-11-01), Lee
patent: 6495404 (2002-12-01), Teramoto et al.
patent: 6537863 (2003-03-01), Jung
patent: 6541918 (2003-04-01), Yudasaka
patent: 2001/0000011 (2001-03-01), Zhang et al.
patent: 2001/0021544 (2001-09-01), Ohnuma et al.
patent: 2001/0050364 (2001-12-01), Tanaka et al.
patent: 2002/0053670 (2002-05-01), Ohtani et al.
patent: 0 651 431 (1995-05-01), None
patent: 0978877 (2000-02-01), None
patent: 04130735 (1992-05-01), None
patent: 7-183540 (1995-07-01), None
patent: 07335547 (1995-12-01), None
patent: 10-92576 (1998-04-01), None
patent: 11-097702 (1999-04-01), None
patent: 11261077 (1999-09-01), None
patent: 2001326178 (2001-11-01), None
patent: 2001326363 (2001-11-01), None
patent: WO 90/13148 (1990-11-01), None
JP 11-097702 English abstract.
English abstract re Japanese Patent Application No. JP 7-183540, published Jul. 21, 1995.
Kokubo Chiho
Makita Naoki
Ohnuma Hideto
Tanaka Koichiro
Tsuchimoto Shuhei
Cook Alex McFarron Manzo Cummings & Mehler, Ltd.
Estrada Michelle
Fourson George
Semiconductor Energy Laboratory Co,. Ltd.
Sharp Kabushiki Kaisha
LandOfFree
Semiconductor device and manufacturing method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device and manufacturing method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and manufacturing method thereof will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3366833