Semiconductor device and fabrication process thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257382, 257628, 257756, H01L 2702, H01L 2708

Patent

active

058959483

ABSTRACT:
A silicon layer serving as a contact plug directly connected to a diffusion layer of a MOS transistor is provided. On a surface of an N.sup.- type diffusion layer in self-alignment with a silicon nitride layer spacer and a field oxide layer, an N.sup.+ type monocrystalline silicon layer formed by anisotropic selective epitaxial growth method is directly connected. The surface of the N.sup.+ type monocrystalline silicon layer is directly connected to an N.sup.+ type monocrystalline silicon layer formed by isotropic selective epitaxial growth.

REFERENCES:
patent: 5373178 (1994-12-01), Motoyoshi et al.
patent: 5399890 (1995-03-01), Okada et al.
patent: 5705838 (1998-01-01), Jost et al.
patent: 5706164 (1998-01-01), Jeng
patent: 5729034 (1998-03-01), Park
patent: 5736770 (1998-04-01), Asai et al.
patent: 5780882 (1998-07-01), Sugiura et al.
H. Hada et al., "A Self-Aligned Contact Technology Using Anisotropical Selective Epitaxial Silicon For Giga-Bit DRAM", IEDM, 1995, pp. 665-668.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and fabrication process thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and fabrication process thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and fabrication process thereof will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2249564

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.