Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2011-08-16
2011-08-16
Tran, Andrew Q (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S189090, C365S228000, C365S226000, C365S149000
Reexamination Certificate
active
08000160
ABSTRACT:
A semiconductor device includes a monitor voltage transfer unit and a voltage generating unit. The monitor voltage transfer unit selects one of a plurality of internal voltages including a cell plate voltage in accordance with a test mode to output it to a voltage monitor pad or outputs an external voltage supplied from the voltage monitor pad as a first pre cell plate voltage. The voltage generating unit generates the cell plate voltage using any one of the first pre cell plate voltage and a second pre cell plate voltage generated within itself in accordance with the test mode. The semiconductor device can generate a pre cell plate voltage at the desired level.
REFERENCES:
patent: 6778460 (2004-08-01), Jung
patent: 7675331 (2010-03-01), Jung
patent: 7688647 (2010-03-01), Jung
patent: 7898317 (2011-03-01), Choi
patent: 1019930008886 (1993-09-01), None
patent: 1020040059461 (2004-07-01), None
patent: 1020050079537 (2005-08-01), None
Hynix / Semiconductor Inc.
Ladas & Parry LLP
Tran Andrew Q
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