Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-09-11
2007-09-11
Parker, Kenneth (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S314000, C257S322000, C257S347000, C257S391000, C257S407000, C257SE29129, C257S029000, C365S185030
Reexamination Certificate
active
10643690
ABSTRACT:
The present invention provides a semiconductor nonvolatile memory in which writing or erasing of storing information can be carried out at a high speed with low consumption power and in which dispersion width of a threshold voltage after writing or erasing is very narrow.A channel region of a memory transistor is divided into two regions of a writing control region and a writing region. The writing control region and the writing region have different threshold voltages. Writing is only carried out in the writing region. The writing control region turns off when the amount of electric charges accumulated in a floating gate reaches a specific value due to writing. The writing control region is used as a switch for a writing operation to automatically stop writing. Accordingly, an involatile memory comprising a memory transistor, in which writing can be carried out at a high speed with low consumption power and which is superior in controlling a threshold voltage after writing or erasing, can be obtained.
REFERENCES:
patent: 4016588 (1977-04-01), Ohya et al.
patent: 4630086 (1986-12-01), Sato et al.
patent: 4642881 (1987-02-01), Matsukawa et al.
patent: 4727043 (1988-02-01), Matsumoto et al.
patent: 5028553 (1991-07-01), Esquivel et al.
patent: 5065201 (1991-11-01), Yamauchi
patent: 5215934 (1993-06-01), Tzeng
patent: 5273926 (1993-12-01), Tigelaar
patent: 5406524 (1995-04-01), Kawamura et al.
patent: 5411905 (1995-05-01), Acovic et al.
patent: 5449941 (1995-09-01), Yamazaki et al.
patent: 5455793 (1995-10-01), Amin et al.
patent: 5501996 (1996-03-01), Yang et al.
patent: 5556800 (1996-09-01), Takizawa et al.
patent: 5629222 (1997-05-01), Yamazaki et al.
patent: 5656845 (1997-08-01), Akbar
patent: 5677867 (1997-10-01), Hazani
patent: 5777359 (1998-07-01), Ra
patent: 5841693 (1998-11-01), Tsukiji
patent: 5847411 (1998-12-01), Morii
patent: 5883832 (1999-03-01), Tempel et al.
patent: 5897354 (1999-04-01), Kachelmeier
patent: 5929480 (1999-07-01), Hisamune
patent: 5973357 (1999-10-01), Uenoyama et al.
patent: 5981342 (1999-11-01), Kakoschke et al.
patent: 6057575 (2000-05-01), Jenq
patent: 6147379 (2000-11-01), Hori et al.
patent: 6194270 (2001-02-01), Bottini et al.
patent: RE37199 (2001-05-01), Yamauchi
patent: 6304484 (2001-10-01), Shin et al.
patent: 6335716 (2002-01-01), Yamazaki et al.
patent: 6376875 (2002-04-01), Kakoschke et al.
patent: 6384448 (2002-05-01), Forbes
patent: 6432762 (2002-08-01), Dalla Libera et al.
patent: 6514842 (2003-02-01), Prall et al.
patent: 6576950 (2003-06-01), Cappelletti et al.
patent: 6621130 (2003-09-01), Kurokawa et al.
patent: 6624025 (2003-09-01), Hsieh et al.
patent: 6818509 (2004-11-01), Park et al.
patent: 0 573 170 (1993-12-01), None
patent: 09-092737 (1997-04-01), None
patent: 2691385 (1997-09-01), None
patent: 11-143379 (1999-05-01), None
Chu, S. et al, “The Effect of Trench-Gate-Oxide Structure on EPROM Device Operation,” IEEE Electron Device Letters, vol. 9, No. 6, pp. 284-286, June (1988).
Kato Kiyoshi
Kurokawa Yoshiyuki
Cook Alex McFarron Manzo Cummings & Mehler, Ltd.
Fenty Jesse A.
Parker Kenneth
Semiconductor Energy Laboratory Co,. Ltd.
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