Semiconductor device and a manufacturing method of the same

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S109000, C257SE21509, C257SE21705

Reexamination Certificate

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07981788

ABSTRACT:
The degree of freedom of the chip layout in a semiconductor device is improved, and improvement in packaging density is aimed at.Since it becomes possible to form the wire of two directions on the pad of a memory chip by performing the over-bonding of reverse bonding by ball bonding, an effect equivalent to continuation stitch bonding of wedge bonding can be produced by ball bonding. Hereby, the degree of freedom of a chip layout and the degree of freedom of the lead layout of substrate3can be improved, and the packaging density on a substrate in a chip lamination type semiconductor device (memory card) can be improved.

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patent: 2004-207292 (2004-07-01), None

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