Semiconductor device and a fabrication process thereof

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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Details

C438S597000, C438S627000, C438S648000, C257SE21476

Reexamination Certificate

active

07407888

ABSTRACT:
A method of fabricating a semiconductor device comprises the steps of forming a contact hole in an insulation film so as to extend therethrough and so as to expose a conductor body at a bottom part of the contact hole, forming a barrier metal film of tungsten nitride on the bottom part and a sidewall surface of the contact hole with a conformal shape to the bottom part and the sidewall surface of the contact hole, forming a tungsten layer so as to fill the contact hole via the barrier metal film, and forming a tungsten plug in the contact hole by the tungsten layer by polishing away a part of the tungsten film on the insulation film until a surface of the insulation film is exposed, wherein there is conducted a step of cleaning a surface of the conductor body prior to the forming step of the barrier metal film.

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patent: 6162715 (2000-12-01), Mak et al.
patent: 6309713 (2001-10-01), Mak et al.
patent: 2004/0029377 (2004-02-01), Lee et al.
patent: 2004/0171241 (2004-09-01), Kitamura et al
patent: 8-45878 (1996-02-01), None
patent: 11-214650 (1999-08-01), None
patent: 2000-106398 (2000-04-01), None

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