Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-07-15
2008-07-15
Le, Thao X. (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S029000
Reexamination Certificate
active
07400007
ABSTRACT:
A power MOSFET includes an n-type drift layer and a p-type base layer formed in a layered manner on the n-type drift layer. Trench gates are formed to penetrate the p-type base layer to reach the n-type drift layer. On the p-type base layer, n+-type source regions and p+-type regions are formed. These n+-type source regions and p+-type regions are arranged alternately along a longitudinal direction of the trench gates. The n+-type source regions and the p+-type regions are arranged with a slant with respect to the longitudinal direction of the trench gates.
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Arai Kiyotaka
Kawaguchi Yusuke
Matsuki Hirobumi
Ono Syotaro
Yamaguchi Yoshihiro
Kabushiki Kaisha Toshiba
Le Thao X.
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Ullah Elias
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