Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257SE27060

Reexamination Certificate

active

07932567

ABSTRACT:
Disclosed herein is a semiconductor device including: first and second transistors, each of the first and second transistors being formed with a plurality of fin transistors, and the first and second transistors being connected in parallel to electrically share a source, wherein the plurality of fin transistors each include a fin activation layer, the fin activation layer protruding from a semiconductor substrate, a source layer serving as the source being formed on one end, and a drain layer on the other end of the fin activation layer so as to form a channel region, the fin activation layers are arranged adjacent to each other in parallel, and the drain layers are disposed so that the currents flow through the plurality of fin transistors in opposite directions between the first and second transistors.

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European Search Report corresponding to European Serial No. 090003618.7 dated Jul. 13, 2009.
Lederer , D. et al., “FinFET Analogue Characterization from DC to 100 GHz”, Solid State Electronics, Elsevier Science Publishers, vol. 49, No. 9; Sep. 1, 2005.

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