Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2011-06-14
2011-06-14
Nguyen, Viet Q (Department: 2827)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S211000, C365S228000, C365S189110
Reexamination Certificate
active
07961500
ABSTRACT:
There is provided a technique for ensuring both an SNM and a write margin simultaneously in a semiconductor device having static memory cells. A semiconductor device has a plurality of static memory cells. The semiconductor device includes a memory cell array having the static memory cells arranged in a matrix, a temperature sensor circuit for sensing a temperature in the semiconductor device, and a word driver for controlling a voltage supplied to a word line of the memory cell array based on an output of the temperature sensor circuit at the time of writing to or reading from a memory cell.
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Mattingly & Malur, P.C.
Nguyen Viet Q
Renesas Electronics Corporation
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