Static information storage and retrieval – Read/write circuit – Testing
Patent
1981-10-09
1984-07-10
Popek, Joseph A.
Static information storage and retrieval
Read/write circuit
Testing
365155, 365190, G11C 1140
Patent
active
044596863
ABSTRACT:
A semiconductor device, such as a bipolar semiconductor memory device, includes an internal circuit and a reference signal generating circuit. The difference in potential between at least one internal signal produced by the internal circuit and a reference signal, which is called a noise margin, is decreased during a test mode, rather than during a usual or normal mode, so that the device artificially obtains a high temperature state at room temperature.
REFERENCES:
patent: 4164791 (1979-08-01), Homma
patent: 4322820 (1982-03-01), Toyoda
patent: 4348747 (1982-09-01), Takahashi
Fujitsu Limited
Popek Joseph A.
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