Semiconductor device

Static information storage and retrieval – Read/write circuit – Testing

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

365155, 365190, G11C 1140

Patent

active

044596863

ABSTRACT:
A semiconductor device, such as a bipolar semiconductor memory device, includes an internal circuit and a reference signal generating circuit. The difference in potential between at least one internal signal produced by the internal circuit and a reference signal, which is called a noise margin, is decreased during a test mode, rather than during a usual or normal mode, so that the device artificially obtains a high temperature state at room temperature.

REFERENCES:
patent: 4164791 (1979-08-01), Homma
patent: 4322820 (1982-03-01), Toyoda
patent: 4348747 (1982-09-01), Takahashi

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1579877

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.