Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent
1998-04-22
1999-11-16
Monin, Jr., Donald L.
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
257379, 257922, 36518509, H01L 2358
Patent
active
059862840
ABSTRACT:
A semiconductor device includes a semiconductor chip, a protective wiring layer, and an abnormality detector. At least one of integrated circuits is formed on the semiconductor chip. The protective wiring layer is formed to be spread on the integrated circuit at a very small interval, and made of a conductive light-shielding material. The protective wiring layer is applied with a power supply voltage upon operating the integrated circuit. The abnormality detector monitors the voltage applied to the protective wiring layer and outputs an abnormality detection signal when the monitored voltage is an abnormal voltage.
REFERENCES:
patent: 5663574 (1997-09-01), Hierold et al.
patent: 5864501 (1999-01-01), Lee
patent: 5889410 (1999-03-01), El-Kareh et al.
Iwamoto Makoto
Kusaba Kazuyuki
Monin, Jr. Donald L.
NEC Corporation
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