Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2009-09-15
2011-12-27
Nhu, David (Department: 2895)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S622000, C257SE21218, C257SE21227, C257SE21231, C257SE21245, C257SE21229, C257SE21267, C257SE21548
Reexamination Certificate
active
08084832
ABSTRACT:
Embodiments relate to a semiconductor device and a method of manufacturing a semiconductor. In embodiments, the method may include a first exposure step of performing an exposure process for forming a first photoresist on a semiconductor substrate at one side of the outside of a trench pattern which will be formed, a first etching step of performing a predetermined dry etching method with respect to the first photoresist, a second exposure step of performing an exposure process for forming a second photoresist at the other side of the outside of the trench pattern, which is a side opposite to the first photoresist, and a second etching step of performing the predetermined dry etching method with respect to the second photoresist.
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patent: 7608545 (2009-10-01), Yun
Dongbu Hi-Tek Co., Ltd.
Nhu David
Sherr & Vaughn, PLLC
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