Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257SE29005, C257SE29066

Reexamination Certificate

active

07838926

ABSTRACT:
A semiconductor device includes a semiconductor substrate; a first base region of a first conductivity type provided in the semiconductor substrate; a buffer region of the first conductivity type provided on a lower surface of the first base region and having an impurity concentration higher than an impurity concentration of the first base region; an emitter region of a second conductivity type provided on a lower surface of the buffer region; a second base region of the second conductivity type selectively provided on an upper surface of the first base region; a diffusion region of the first conductivity type selectively provided on an upper surface of the second base region; a control electrode; a first main electrode; and a second main electrode. A junction interface between the buffer region and the first base region has a concave portion and a convex portion.

REFERENCES:
patent: 6037632 (2000-03-01), Omura et al.
patent: 7132321 (2006-11-01), Kub et al.
patent: 6-61495 (1994-03-01), None
patent: 2002-43573 (2002-02-01), None
patent: 2004-103982 (2004-04-01), None
Masanori Tsukuda, et al., “Critical IGBT Design Regarding EMI and Switching Losses”, Proceedings of the 20thInternational Symposium on Power Semiconductor Devices & IC's, May , 2008, pp. 185-188.
H.P. Felsl, et al., “The CIBH Diode—Great Improvement for Ruggedness and Softness of High Voltage Diodes”, Proceedings of the 20thInternational Symposium on Power Semiconductor Devices & IC's, May, 2008, pp. 173-176.

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