Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With window means

Reexamination Certificate

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Details

C257S681000, C257S447000, C438S116000

Reexamination Certificate

active

07605455

ABSTRACT:
With this semiconductor device, the distortion and cracking of a thinned portion of a semiconductor substrate are prevented to enable high precision focusing with respect to a photodetecting unit and uniformity and stability of high sensitivity of the photodetecting unit to be maintained. A semiconductor device1has a semiconductor substrate10,a wiring substrate20,conductive bumps30,and a resin32.A CCD12and a thinned portion14are formed on semiconductor substrate10.Electrodes16of semiconductor substrate10are connected via conductive bumps30to electrodes22of wiring substrate20.Wiring substrate20has formed therein a groove portion26athat surrounds a region opposing thinned portion14and groove portions26bthat extend to an exposed surface of wiring substrate20from groove portion26a. Insulating resin32fills a gap between outer edge15of thinned portion14and wiring substrate20to reinforce the bonding strengths of conductive bumps30.

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