Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2006-09-29
2009-06-09
Tan, Vibol (Department: 2819)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S225700, C365S230060, C326S010000, C326S012000
Reexamination Certificate
active
07545688
ABSTRACT:
There is provided a semiconductor device including: plural macros each having plural normal blocks and a redundant block to be used as a replacement for a normal block; a first replacement information storage unit storing first replacement macro information to designate a macro to be subjected to the replacement out of the plural macros and first replacement block information to designate a normal block to be subjected to the replacement; a first transmission line serially connecting the plural macros; and a replacement information transmission circuit transmitting replacement information to the designated normal block in the designated macro via the first transmission line based on the first replacement macro information and the first replacement block information.
REFERENCES:
patent: 5831993 (1998-11-01), Graef
patent: 5982194 (1999-11-01), Worrell
patent: 6822912 (2004-11-01), Shimizu et al.
patent: 7205785 (2007-04-01), Carlson
patent: 2007/0070693 (2007-03-01), Nakano et al.
patent: 2004-039680 (2004-02-01), None
Arent & Fox LLP
Fujitsu Microelectronics Limited
Tan Vibol
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