Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2006-12-28
2008-10-21
Nguyen, Tan T. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Testing
C365S189070, C365S226000
Reexamination Certificate
active
07440346
ABSTRACT:
A semiconductor memory device includes a high voltage generator for generating a high voltage and applying the generated high voltage to a memory unit, a converter for converting an output voltage of the high voltage generator into a digital signal, and a mode selection unit for outputting an output of the converter or an output of the memory unit through an I/O terminal selectively.
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Hynix / Semiconductor Inc.
Nguyen Tan T.
Townsend and Townsend / and Crew LLP
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