Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S043000, C257S306000, C438S003000, C438S104000

Reexamination Certificate

active

07348617

ABSTRACT:
A semiconductor device comprising a ferroelectric capacitor having improved reliability is disclosed. According to one aspect of the present invention, it is provided a semiconductor device comprising a transistor formed on a semiconductor substrate, a ferroelectric capacitor formed above the transistor and comprising a lower electrode, a ferroelectric film and an upper electrode, a first hydrogen barrier film formed over the ferroelectric capacitor, an insulator formed over the first hydrogen barrier film, a contact plug disposed in the insulator and electrically connected with the upper electrode, a second hydrogen barrier film disposed between the contact plug and the insulator continuously, and a wiring connected with the contact plug.

REFERENCES:
patent: 5661345 (1997-08-01), Wada et al.
patent: 2002/0121699 (2002-09-01), Cheng et al.
patent: 2002/0132469 (2002-09-01), Lee et al.
patent: 2003/0001192 (2003-01-01), Yamanobe
patent: 2003/0027385 (2003-02-01), Park et al.
patent: 2003/0089954 (2003-05-01), Sashida
patent: 2003/0216056 (2003-11-01), Yoon
patent: 2004/0099893 (2004-05-01), Martin et al.
patent: 2005/0173799 (2005-08-01), Jou et al.
patent: 2005/0199928 (2005-09-01), Mikawa et al.
patent: 2005/0224979 (2005-10-01), Marathe et al.
patent: 2006/0261483 (2006-11-01), Tsumura et al.
patent: 2001-291843 (2001-10-01), None
U.S. Appl. No. 11/142,441, filed Jun. 2, 2005, Yoshinori Kumura, et al.

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