Static information storage and retrieval – Read/write circuit – Simultaneous operations
Reexamination Certificate
2007-12-18
2007-12-18
Tran, Michael T (Department: 2827)
Static information storage and retrieval
Read/write circuit
Simultaneous operations
C365S201000
Reexamination Certificate
active
11069954
ABSTRACT:
A semiconductor device includes a first memory block having a first address space, a second memory block having a second address space which is smaller than the first address space, and a test circuit which supplies a test address and a test control signal to the first memory block and the second memory block, and tests the first memory block and the second memory block simultaneously. The second memory block has a storage circuit which stores an address corresponding to the second address space, and a control circuit which inactivates the test control signal when the test address falls outside the second address space.
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Itoga Naoko
Iwai Hitoshi
Kabushiki Kaisha Toshiba
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Tran Michael T
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