Semiconductor device

Static information storage and retrieval – Read/write circuit – Simultaneous operations

Reexamination Certificate

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Details

C365S201000

Reexamination Certificate

active

11069954

ABSTRACT:
A semiconductor device includes a first memory block having a first address space, a second memory block having a second address space which is smaller than the first address space, and a test circuit which supplies a test address and a test control signal to the first memory block and the second memory block, and tests the first memory block and the second memory block simultaneously. The second memory block has a storage circuit which stores an address corresponding to the second address space, and a control circuit which inactivates the test control signal when the test address falls outside the second address space.

REFERENCES:
patent: 2003/0002361 (2003-01-01), Fischer et al.
patent: 2003/0107926 (2003-06-01), Ohmura et al.
patent: 2004/0085825 (2004-05-01), Narita et al.
patent: 2004/0218431 (2004-11-01), Chung et al.
patent: 2005/0002243 (2005-01-01), Mohr et al.
patent: 7-70240 (1995-03-01), None
patent: 11-203893 (1999-07-01), None
patent: 2001-118397 (2001-04-01), None
patent: 2001-236798 (2001-08-01), None
patent: 2002-157900 (2002-05-01), None
patent: 2002-260400 (2002-09-01), None

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