Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-09-18
2007-09-18
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S076110
Reexamination Certificate
active
11485436
ABSTRACT:
An infrared radiation image pickup apparatus, the image pickup elements of which are each formed by a bolometer, is disclosed. The resistance value of the bolometer outside a preset range in a given readout circuit associated with a given image pickup element does not affect other readout circuits performing parallel operations with the readout circuit. The readout circuit includes an OP amplifier5, a non-inverting input terminal of which is connected to an output of a D/A converter7, a MOS transistor4, and a switch6. The MOS transistor4has a gate connected to an output terminal of the OP amplifier5and has a source connected to an inverting input terminal of the OP amplifier5and connected via a horizontal switch3to a bolometer1. The switch6is connected between the gate and the source of the MOS transistor4. The D/A converter7receives data for applying a bias voltage to the bolometer1, and outputs the bias voltage. In case at least the output voltage of the D/A converter7is outside a preset range, that is, in case input data to the D/A converter7is preset data, the input data is decoded by a decoder8, and the horizontal switch3is opened by an output of a NOR circuit9a, while the switch6is short-circuited.
REFERENCES:
patent: 6359460 (2002-03-01), Tanaka
patent: 2003/0230733 (2003-12-01), Tanaka
patent: 9-284652 (1997-10-01), None
patent: 2003-318712 (2003-11-01), None
patent: 2004-20325 (2004-01-01), None
NEC Electronics Corporation
Nguyen Vincent Q.
Young & Thompson
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