Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate
2006-01-03
2006-01-03
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
For fault location
C324S522000, C324S765010
Reexamination Certificate
active
06982555
ABSTRACT:
PMISFETs and NMISFETs are placed in a capacitance measuring circuit. Each of interconnects is connected via the corresponding PMISFET through a charging voltage supply part to a power supply pad and via the corresponding NMISFET through a current sampling part to a current-monitoring pad. A current I can be measured by bringing a probe of an ammeter into contact with the current-monitoring pad.
REFERENCES:
patent: 5677634 (1997-10-01), Cooke et al.
patent: 6300765 (2001-10-01), Chen
patent: 6624651 (2003-09-01), Fried et al.
patent: 6731129 (2004-05-01), Belluomini et al.
patent: 6838869 (2005-01-01), Rogers et al.
Kanamoto Toshiki
Kunikiyo Tatsuya
Watanabe Tetsuya
Yamashita Kyoji
Deb Anjan
McDermott Will & Emery LLP
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