Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device
Reexamination Certificate
2006-01-31
2006-01-31
Tran, Michael (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Charge transfer device
C257S244000, C257S330000
Reexamination Certificate
active
06992340
ABSTRACT:
A semiconductor device includes spaced-apart first and second element formation regions which are formed in a main surface of a semiconductor substrate, a dielectric film which is formed on the main surface of the semiconductor substrate at a location between the first and second element formation regions, first electrode patterns which are formed above the first and second element formation regions respectively and each of which has an end portion extended to overlie the dielectric film, the first electrode patterns being formed by patterning of a first electrode layer, second electrode patterns formed above the first electrode patterns respectively, and a passivation film which is formed above the first electrode patterns to be positioned adjacent to the second electrode patterns while covering part of the dielectric film which is exposed during patterning of the first electrode layer.
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U.S. Appl. No. 10/437,060, filed May 14, 2003, Tanaka.
U.S. Appl. No. 10/814,246, filed Apr. 1, 2004, Okuno et al.
Kabushiki Kaisha Toshiba
Nguyen Thinh T
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Tran Michael
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