Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device

Reexamination Certificate

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C257S244000, C257S330000

Reexamination Certificate

active

06992340

ABSTRACT:
A semiconductor device includes spaced-apart first and second element formation regions which are formed in a main surface of a semiconductor substrate, a dielectric film which is formed on the main surface of the semiconductor substrate at a location between the first and second element formation regions, first electrode patterns which are formed above the first and second element formation regions respectively and each of which has an end portion extended to overlie the dielectric film, the first electrode patterns being formed by patterning of a first electrode layer, second electrode patterns formed above the first electrode patterns respectively, and a passivation film which is formed above the first electrode patterns to be positioned adjacent to the second electrode patterns while covering part of the dielectric film which is exposed during patterning of the first electrode layer.

REFERENCES:
patent: 5503882 (1996-04-01), Dawson
patent: 5798554 (1998-08-01), Grimaldi et al.
patent: 5963837 (1999-10-01), Ilg et al.
patent: 6329288 (2001-12-01), Tokushige et al.
U.S. Appl. No. 10/437,060, filed May 14, 2003, Tanaka.
U.S. Appl. No. 10/814,246, filed Apr. 1, 2004, Okuno et al.

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