Semiconductor device

Static information storage and retrieval – Read/write circuit – Signals

Reexamination Certificate

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C365S207000, C365S233100

Reexamination Certificate

active

06925017

ABSTRACT:
A column select line YS1can be enabled at the same time as the enabling of a word line. Write data is written from an I/O gate into a selected data line. An adjacent unselected sense amplifier reads data from memory cells. A source node of a cross-coupled sense amplifier connected to each data line pair is divided for each column select line, thereby to prevent a write-selected cross-coupled amplifier from driving the source node. In the write operation, data can be written at a high speed. On the other hand, it becomes possible to prevent a write-sense amplifier from driving the source node. Therefore, adjacent sense amplifiers can achieve stable read operation without being affected from the write-sense amplifier.

REFERENCES:
patent: 2002/0093864 (2002-07-01), Ooishi
patent: 2003/0002315 (2003-01-01), Ooishi
patent: 2001-256782 (2001-09-01), None
“WP 24.1 An 8ns Random Cycle Embedded RAM Macro with Dual-Port Interleaved DRAM Architecture (D2RAM)”, 2000 IEEE International Solid-State Circuits Conference, 07803-5853-Aug. 2000.

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