Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S503000

Reexamination Certificate

active

06917075

ABSTRACT:
A semiconductor device and a method of fabricating the same according to this invention are such that: a gate insulator is formed over a predetermined region of a semiconductor substrate; a gate electrode is formed on the gate insulator; source and drain regions respectively formed in portions of the predetermined region that are situated on both sides of the gate electrode in plan view; a body region formed by a region of the predetermined region exclusive of the source and drain regions; and a contact electrically interconnecting the gate electrode and the body region, wherein a portion of the contact which is connected to the gate electrode is formed to intersect the gate electrode in plan view.

REFERENCES:
patent: 5559368 (1996-09-01), Hu et al.
patent: 5814867 (1998-09-01), Saito
patent: 6355492 (2002-03-01), Tanaka et al.
patent: 6534840 (2003-03-01), Esaki
patent: 6753555 (2004-06-01), Takagi et al.
Fariborz Assaderaghi, et al., “A Dynamic Threshold Voltage Mosfet (DTMOS) for Very Low Voltage Operation”, 1994 IEEE, pp. 510-512.

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