Semiconductor device

Details Semiconductor device Semiconductor device

2005-01-04

2005-01-04

Cuneo, Kamand (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S1540PB, C365S201000, C438S014000, C438S017000

Reexamination Certificate

active

06838891

ABSTRACT:
A semiconductor device includes a plurality of semiconductor integrated circuits formed on a semiconductor wafer; an testing pad for inputting and outputting a signal to and from an internal circuit of the semiconductor integrated circuit; a switch for switching a state of a connection between the semiconductor integrated circuit and the testing pad; and a wiring pattern formed on a parting line around the semiconductor integrated circuit and connected to an input terminal of the switch. When the semiconductor integrated circuits are separated, cutting off of the wiring pattern causes the switch to be turned off, so that the internal circuit is prevented from being affected by the influence of the cutting plane.

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patent: 03185756 (1991-08-01), None
patent: 06061298 (1994-04-01), None
patent: 11031785 (1999-02-01), None

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