Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-12-13
2005-12-13
Munson, Gene M. (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S338000, C257S350000
Reexamination Certificate
active
06975003
ABSTRACT:
An N-channel transistor includes: an N-type source region, a gate electrode, a P-type body region, an N-type drain offset region, and a drain contact region, which is an N-type drain region. The transistor further includes a gate insulating film that has a thin oxide silicon film (a thin film portion) and a LOCOS film (a thick film portion). The body region has an impurity profile in which the concentration reaches a maximum value near the surface and decreases with distance from the surface. The drain offset region has an impurity profile that has an impurity-concentration peak in a deep portion located a certain depth-extent below the lower face of the LOCOS film.
REFERENCES:
patent: 5929493 (1999-07-01), Wu
patent: 6313508 (2001-11-01), Kobayashi
Matsui Osamu
Sato Yoshinobu
Matsushita Electric - Industrial Co., Ltd.
McDermott Will & Emery LLP
Munson Gene M.
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