Semiconductor circuit with multiple contact sizes

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Bump leads

Reexamination Certificate

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Details

C257S691000, C257S693000, C257S775000, C438S613000

Reexamination Certificate

active

07084500

ABSTRACT:
A semiconductor circuit comprising a semiconductor die and a package substrate. In one embodiment, a first plurality of conductive bumps serves as a portion of a conductive path between contacts on the semiconductor die and contacts on the package substrate. A second plurality of conductive bumps serves as a portion of a conductive path between other contacts on the die and contacts on the package substrate. Each of the bumps in the first plurality of conductive bumps is larger than each of the bumps in the second plurality of conductive bumps. In another embodiment, the average size of the first plurality of conductive bumps may be at least 20% larger (or greater) than the average size of the second plurality of bumps.

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U.S. Appl. No. 10/453,445, Swanson et al. filed Jun. 3, 2003 “Semiconductor Circuit with Multiple Contact Sizes”.

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