4. Optics: measuring and testing
  5. By alignment in lateral direction
  6. With light detector

Mamoru Okanishi

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Semiconductor chip position detector

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Semiconductor laser device and wire bonding method capable...

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Total dielectric isolation
Reexamination Certificate

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Semiconductor laser device and wire bonding method capable...

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – With housing or contact structure
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1632337

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