Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1994-11-21
1996-12-03
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324765, 439 73, 439330, G01R 3102
Patent
active
055811957
ABSTRACT:
An appartus for testing bare semiconductor chips, especially for burn-in testing, includes a chip holding socket which comprises a substrate portion having at least one pair of opposing grooves formed along respective edges thereof. A pair of resilient elongate members are inserted into the grooves, and act to hold a respective bare chip in the holding socket. Preferably, a plurality of such holding sockets are mounted and electrically connected to a main test board, by which test signals are provided to test the bare semiconductor chips. A method for manufacturing such a testing apparatus is also disclosed herein.
REFERENCES:
patent: 4725918 (1988-02-01), Bakker
patent: 5057031 (1991-10-01), Sinclair
patent: 5288240 (1994-02-01), Savant
patent: 5322446 (1994-06-01), Cearley-Cabbiness
patent: 5348489 (1994-09-01), Yeh
Jeong Hyeon J.
Lee Kyu J.
Karlsen Ernest F.
Kobert Russell M.
Samsung Electronics Co,. Ltd.
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