Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Patent
1997-10-14
1999-09-21
Dutton, Brian
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
G01R 3126, H01L 2166
Patent
active
059565675
ABSTRACT:
A semiconductor chip having an internal circuit providing a prescribed function is provided. The semiconductor chip includes: a signal pad to be used for input and/or output of a signal to and/or from the internal circuit; a first power supply pad to be used for supplying electric power to the internal circuit both in a mounted condition and in an operational test with a probe; and a second power supply pad to be used for supplying electric power to the internal circuit in the operational test with the probe.
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Dutton Brian
Matsushita Electric - Industrial Co., Ltd.
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