Semiconductor chip and manufacturing method for the same,...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C257S698000, C257SE21597, C438S589000

Reexamination Certificate

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11003769

ABSTRACT:
The invention provides a semiconductor chip manufacturing method including the steps of: forming a concave portion extended in the thickness direction of a semiconductor substrate which has a front surface and a rear surface and has a function device formed on the front surface, from the front surface; forming an oxidation preventive film made of an inert first metal material by supplying the first metal material onto the inner wall surface of the concave portion; supplying a second metal material containing a metal which is oxidized more easily than the first metal material to the inside of the concave portion after the step of forming the oxidation preventive film; electrically connecting the second metal material supplied to the inside of the concave portion and the function device; and thinning the semiconductor substrate so that the thickness thereof becomes thinner than the depth of the concave portion by removing the semiconductor substrate from the rear surface while leaving the oxidation preventive film.

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patent: 5814889 (1998-09-01), Gaul
patent: 6583030 (2003-06-01), Grassl
patent: 6809421 (2004-10-01), Hayasaka et al.
patent: 2002/0094449 (2002-07-01), Takeuchi et al.
patent: 10-223833 (1998-08-01), None
patent: 2000-299350 (2000-10-01), None
patent: 2001-053218 (2001-02-01), None
patent: 2001-319940 (2001-11-01), None
patent: 2002-167676 (2002-06-01), None
patent: 2002-530891 (2002-09-01), None

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