Semiconductor capacitor and MOSFET fitted therewith

Semiconductor device manufacturing: process – Forming schottky junction – Using refractory group metal

Reexamination Certificate

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Reexamination Certificate

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07060600

ABSTRACT:
In accordance with the invention the semiconductor capacitor includes a first capacitor electrode1, a second capacitor electrode3and a capacitor dielectric5which is arranged between the two capacitor electrodes and which includes praseodymium oxide. It is distinguished in that the second capacitor electrode3includes praseodymium silicide.

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patent: 6656852 (2003-12-01), Rotondaro et al.
patent: 2002/0036313 (2002-03-01), Yang et al.
patent: 2003/0119291 (2003-06-01), Ahn
patent: 2003/0193061 (2003-10-01), Osten
patent: 2003/0228747 (2003-12-01), Ahn et al.
patent: 2005/0145959 (2005-07-01), Forbes et al.
patent: WO 02/097895 (2002-12-01), None
Surface Science 504 (2002) 159-166, XP-001189099, Initial stages of praseodymium oxide film formation on Si(001), H.-J. Müssig et al., IHP, Im Technologiepark 25, D-15236 Frankfurt (Oder), Germany; received Sep. 8, 2001, accepted for publication Dec. 3, 2001.
2001 IRW Final Report, 0-7803-7167-Apr. 1, 2001 IEEE, Can Praseodymium Oxide be an Alternative High-K Gate Dielectric Material for Silicon Integrated Circuits?, H. -J Müssig et al., IHP, Im Technologiepark 25, D-15236 Frankfurt (Oder), Germany.

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