Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-04-27
2010-02-16
Levin, Naum B (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C438S622000, C438S691000
Reexamination Certificate
active
07665055
ABSTRACT:
A design method places a dummy line in floating state in a line layer of a semiconductor apparatus by using a computer. The method includes a first step of reading layout data and placing a dummy line with a longitudinal side lying in parallel with a signal line in an area where a pattern density of the signal line in a prescribed area is equal to or lower than a density lower limit, and a second step of dividing a dummy line placed in an area where a distance from the signal line is equal to or shorter than a dummy dividing distance.
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Foley & Lardner LLP
Levin Naum B
NEC Electronics Corporation
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