Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2006-06-27
2010-11-23
Nguyen, Tuan T (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S226000, C365S189110, C365S189050
Reexamination Certificate
active
07839708
ABSTRACT:
A semiconductor apparatus, configured to operate on different internal voltages generated from electromagnetic waves received via an antenna, to extract a command and data from the received electromagnetic waves, and to operate according to the extracted command, includes internal circuitry configured to generate and output binary signals according to a command input from the outside in a test operation for performing a predetermined test; and output circuits corresponding to some or all of the internal voltages and configured to convert the binary signals output from the internal circuitry into binary signals having same voltages as the corresponding internal voltages and to output the converted binary signals to the outside.
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First Office Action of Chinese Application No. 200680000881.0 dated Aug. 8, 2008 (8 pages).
Dickstein & Shapiro LLP
Nguyen Tuan T
Reidlinger R Lance
Ricoh & Company, Ltd.
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