Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
Patent
1996-05-22
1998-10-27
Oda, Christine K.
Measuring and testing
Speed, velocity, or acceleration
Acceleration determination utilizing inertial element
73 138, G01P 1512
Patent
active
058279679
ABSTRACT:
A semiconductor accelerometer having a sensor element which includes a support frame, a silicon mass, flexures connected to the support frame and the silicon mass, semiconductor strain gauges formed on the flexures, and a staggered arrangement of diffusion resistors for adjusting any offset value variation. Aluminum wiring is connected to the strain gauges to form a Wheatstone bridge circuit, and a housing is provided to cover the sensor element.
REFERENCES:
patent: 4553436 (1985-11-01), Hansson
patent: 4633099 (1986-12-01), Tanabe
patent: 4641539 (1987-02-01), Vilimek
patent: 4848157 (1989-07-01), Kobayashi
patent: 5103667 (1992-04-01), Allen et al.
patent: 5251485 (1993-10-01), Kondo
Nishikawa Mutsuo
Ueyanagi Katsumichi
Fuji Electric & Co., Ltd.
Fujitsu Ten Limited
Oda Christine K.
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