4. Measuring and testing
  5. Speed, velocity, or acceleration
  6. Acceleration determination utilizing inertial element

Katsumichi Ueyanagi

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Container for semiconductor sensor, manufacturing method...

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With semiconductor element forming part
Reexamination Certificate

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Integrated sensor including a pressure sensor and a...

Measuring and testing – Fluid pressure gauge – With pressure and/or temperature compensation
Reexamination Certificate

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Layout of semiconductor integrated circuit

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method for making a semiconductor acceleration sensor

Glass manufacturing – Processes – Fusion bonding of glass to a formed part
Patent

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Open-circuit failure detection circuit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Profile ID: LFUS-PAI-P-160528

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