Measuring and testing – Instrument proving or calibrating – Speed – velocity – or acceleration
Patent
1995-10-23
1998-06-02
Chapman, John E.
Measuring and testing
Instrument proving or calibrating
Speed, velocity, or acceleration
73 138, 7351433, G01P 2100
Patent
active
057602905
ABSTRACT:
A semiconductor acceleration sensor has a silicon detecting body and a glass substrate. The silicon detecting body has a weight, a supporting frame, and beams for coupling the weight to the supporting frame, which are integrally processed from a silicon wafer. At least one semiconductor strain gauge is formed on a surface of a beam. The glass substrate is electrostatically joined with the supporting frame of the silicon detecting body. Furthermore, a gap portion is formed between a surface of the glass substrate and a lower surface of the weight.
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Chapman John E.
Fuji Electric & Co., Ltd.
Fujitsu Ten Limited
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