Semi-conductor component, as well as a process for the in-or...

Static information storage and retrieval – Read/write circuit – Testing

Reexamination Certificate

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C365S230080

Reexamination Certificate

active

11253807

ABSTRACT:
The invention relates to a semi-conductor component, and a process for the in- and/or output of test data and/or semi-conductor component operating control data into or from a semi-conductor component, whereby the semi-conductor component comprises one or more useful data memory cells, and/or one or more test data and/or semi-conductor component operating control data registers for storing test data and/or semi-conductor component operating control data, and whereby the process comprises the steps of applying a control signal to the semi-conductor component, whereby the semi-conductor component is switched from a first to a second operating mode; and applying an address signal to the semi-conductor component, whereby one or more of the test data and/or semi-conductor component operating control data registers of the semi-conductor component is addressed by the address signal in the second operating mode, and one or more of the useful data memory cells in the first operating mode.

REFERENCES:
patent: 4951254 (1990-08-01), Ontrop
patent: 5905690 (1999-05-01), Sakurai
patent: 7095661 (2006-08-01), Osaka et al.
patent: 19743001 (1999-04-01), None
patent: 10110627 (2002-09-01), None
Windeck, C. (2000). “Speicherriegel Enträtselt: Wie Mainboards die Hauptspeicher-Zeitparameter Einstellen (sollten),”Know-how—SDRAM-Speichermodule17:166-173.

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