Self-timed comparison circuits and systems

Static information storage and retrieval – Read/write circuit – Including signal comparison

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

365194, G11C7/00

Patent

active

059056800

ABSTRACT:
In one embodiment there is a comparison circuit (28) for selecting data in response to a first binary quantity (ADDRESS) and a second binary quantity (TAG). The comparison circuit includes a match circuit (34) for outputting a match signal (MATCH) in response to comparing the first binary quantity and the second binary quantity. The comparison circuit also includes a delay circuit (36) for outputting a delay signal (TC.sub.D) in response to a signal generated at a same time as the second binary quantity, and circuitry (38) for outputting a hit signal in response to the match signal and the delay signal. The hit signal indicates that a memory stores data corresponding to the second binary quantity. Still further, the comparison circuit includes dynamic select circuit (40) for outputting a logic state of data corresponding to the first binary quantity and in response to the hit signal. The dynamic select circuit comprises a precharge node (88) and at least one transistor (90) coupled in a discharge path coupled to the precharge node. The at least one transistor is operable to conduct in response to the hit signal reaching a discharge enable voltage such that the precharge node is discharged and the logic state of the data changes in response thereto. The hit signal has various attributes. First, the hit signal is initially at a disable level insufficient to discharge the precharge node of the select circuit. Second, the hit signal transitions from the disable level to the discharge enable voltage in response to the memory storing data corresponding to the second binary quantity. Third, a transition of the delay signal occurs at a time with respect to a transition of the match signal such that the hit signal does not reach the discharge enable voltage of the dynamic select circuit in response to the memory not storing data corresponding to the second binary quantity.

REFERENCES:
patent: 5479641 (1995-12-01), Nadir et al.
patent: 5526503 (1996-06-01), Kim
patent: 5528541 (1996-06-01), Ghia et al.
patent: 5577223 (1996-11-01), Tanoi et al.
patent: 5661694 (1997-08-01), Fukutani et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Self-timed comparison circuits and systems does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Self-timed comparison circuits and systems, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Self-timed comparison circuits and systems will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1765120

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.