Self-testing printed circuit board comprising electrically...

Details Self-testing printed circuit board comprising electrically... Self-testing printed circuit board comprising electrically...

2006-10-24

2006-10-24

Ngô, Ngân V. (Department: 2818)

Active solid-state devices (e.g., transistors, solid-state diode

Field effect device

Having insulated electrode

C257S700000, C257SE27102

Reexamination Certificate

active

07126196

ABSTRACT:
The electrically programmable three-dimensional memory (EP-3DM) can be used to carry the test data and/or test-data seeds for the circuit-under-test (CUT). When integrated with the CUT, EP-3DM has minimum impact to the layout of the CUT. Apparently, CUT with integrated EP-3DM supports IC self-test. Moreover, with a large bandwidth with the CUT, EP-3DM-based IC self-test enables at-speed test.

REFERENCES:
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patent: 5592616 (1997-01-01), Finch et al.
patent: 5835396 (1998-11-01), Zhang
patent: 6034882 (2000-03-01), Johnson et al.
patent: 2002/0052633 (2002-05-01), Prutchi et al.
patent: 2004/0175851 (2004-09-01), Abadeer et al.
patent: 2005/0158912 (2005-07-01), Moden et al.

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