Self-reparable semiconductor and method thereof

Details Self-reparable semiconductor and method thereof Self-reparable semiconductor and method thereof

2004-07-16

2008-03-04

Duncan, Marc (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S013000

Reexamination Certificate

active

07340644

ABSTRACT:
A self-reparable semiconductor includes multiple functional units that perform the same function and that include sub-functional units. The semiconductor includes one or more full or partial spare functional units that are integrated into the semiconductor. If a defect in a sub-functional unit is detected, then that sub-functional unit is switched out and replaced with a sub-functional unit in the full or partial spare functional unit. The reconfiguration is realized with switching devices that are associated with the sub-functional units. Defective functional or sub-functional units can be detected after assembly, during power up, periodically during operation, and/or manually.

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