Self-repair method for nonvolatile memory devices using a...

Static information storage and retrieval – Read/write circuit – Including signal comparison

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S189011, C365S189040, C365S191000, C365S194000

Reexamination Certificate

active

06922366

ABSTRACT:
A self-repair method intervenes at the end of an operation of modification of a nonvolatile memory, selected between programming and erasing, in the event of detection of just one non-functioning cell, and carries out redundancy of the non-functioning cell. To this end, the memory array is divided into a basic portion, formed by a plurality of memory cells storing basic data, and into an in-the-field redundancy portion. The in-the-field redundancy portion is designed to store redundancy data that include a correct content of the non-functioning cell, the address of the non-functioning cell, and an activated redundancy flag. The redundancy is activated only after applying a preset maximum number of modification pulses and uses a redundancy replacement circuit and a redundancy data verification circuit.

REFERENCES:
patent: 5438546 (1995-08-01), Ishac et al.
patent: 5682349 (1997-10-01), Campardo et al.
patent: 5748527 (1998-05-01), Lee et al.
patent: 5751647 (1998-05-01), O'Toole
patent: 5796653 (1998-08-01), Gaultier
patent: 5818791 (1998-10-01), Tanaka et al.
patent: 5909390 (1999-06-01), Harari
patent: 5928370 (1999-07-01), Asnaashari
patent: 6236609 (2001-05-01), Tanzawa et al.
patent: 6418051 (2002-07-01), Manstretta et al.
patent: 6442080 (2002-08-01), Tanzawa et al.
patent: 6459628 (2002-10-01), Bautista et al.
patent: 6498752 (2002-12-01), Hsu et al.
patent: 2002/0012282 (2002-01-01), Saito et al.
patent: 2002/0046318 (2002-04-01), Harari et al.
patent: 0 797 145 (1997-09-01), None
patent: 1 126 372 (2001-08-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Self-repair method for nonvolatile memory devices using a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Self-repair method for nonvolatile memory devices using a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Self-repair method for nonvolatile memory devices using a... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3411009

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.