Self-refresh period measurement circuit of semiconductor device

Details Self-refresh period measurement circuit of semiconductor device Self-refresh period measurement circuit of semiconductor device

2006-08-01

2009-02-03

Phung, Anh (Department: 2824)

Static information storage and retrieval

Read/write circuit

Data refresh

C365S201000

Reexamination Certificate

active

07486583

ABSTRACT:
A self-refresh period measurement circuit of a semiconductor device is disclosed, herein which includes a shift register configured to receive an oscillation signal that is periodically enabled after a self-refresh signal is enabled, to allow a self-refresh operation to be performed, and delay the received oscillation signal by a unit self-refresh period to output a delayed oscillation signal, a period measurement start signal generator configured to receive the self-refresh signal and the oscillation signal and generate a period measurement start signal for setting a time that the oscillation signal is enabled for the first time as a start time for measurement of a self-refresh period, and a refresh period output unit configured to receive the period measurement start signal and the delayed oscillation signal from the shift register and generate a refresh period output signal that is enabled for a period from a time that the period measurement start signal is enabled to a time that the delayed oscillation signal is enabled for the first time.

REFERENCES:
patent: 5495452 (1996-02-01), Cha
patent: 5499213 (1996-03-01), Niimi et al.
patent: 5532968 (1996-07-01), Lee
patent: 5568440 (1996-10-01), Tsukude et al.
patent: 5680359 (1997-10-01), Jeong
patent: 6999368 (2006-02-01), Fujimoto et al.
patent: 2005/0052919 (2005-03-01), Chou
patent: 2005/0243629 (2005-11-01), Lee
patent: 2006/0023546 (2006-02-01), Park
patent: 07-073668 (1995-03-01), None
patent: 2006-048845 (2006-02-01), None

Affiliated with

Also associated with

Rating

Self-refresh period measurement circuit of semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Self-refresh period measurement circuit of semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Self-refresh period measurement circuit of semiconductor device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4113673