Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-06-17
2008-08-12
Wilczewski, M. (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE29021, C438S286000, C438S586000
Reexamination Certificate
active
07411251
ABSTRACT:
In an NLDMOS, DMOS or NMOS active device the ability to withstand snapback under stress conditions is provided by moving the hot spot away from the drain contact region. This is achieved by moving the drain contact region further away from the gate and including an additional n-region next to the drain or an additional floating p-region next to the drain.
REFERENCES:
patent: 5508547 (1996-04-01), Yang
patent: 5592005 (1997-01-01), Floyd et al.
patent: 5767550 (1998-06-01), Calafut et al.
patent: 5804860 (1998-09-01), Amerasekera
patent: 6589833 (2003-07-01), Hu et al.
patent: 6657241 (2003-12-01), Rouse et al.
patent: 7057215 (2006-06-01), Vashchenko et al.
patent: 7115951 (2006-10-01), Vashchenko et al.
patent: 2002/0076876 (2002-06-01), Ker et al.
patent: 2004/0173859 (2004-09-01), Hao et al.
patent: 2006/0186467 (2006-08-01), Pendharkar et al.
patent: 2006/0202265 (2006-09-01), Xu et al.
patent: 2006/0284258 (2006-12-01), Huang et al.
National Semiconductor Corporation
Thomas Toniae M.
Vollrath Jurgen
Wilczewski M.
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