Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
Reexamination Certificate
2011-06-14
2011-06-14
Whitmore, Stacy A (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Testing or evaluating
C700S028000
Reexamination Certificate
active
07962887
ABSTRACT:
Sensors on the integrated circuit are used to detect the current operating state of the chip, such as frequency, voltage, temperature characteristics, or variation in the integrated circuit manufacturing process. In response, the integrated circuit may choose to modify operational parameters (such as frequency, voltage, or power-down states) in order to dynamically and autonomously maintain an optimal performance and/or power-efficiency operational point.
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Anderson Carl John
Floyd Michael Stephen
James Norman Karl
Restle Phillip John
Baca Matthew W.
International Business Machines - Corporation
Whitmore Stacy A
Yee & Associates P.C.
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