Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step
Patent
1981-04-20
1982-10-12
Powell, William A.
Adhesive bonding and miscellaneous chemical manufacture
Delaminating processes adapted for specified product
Delaminating in preparation for post processing recycling step
156646, 156657, 1566591, 156345, 204192E, 204298, 252 791, H01L 21306
Patent
active
043537774
ABSTRACT:
A process for etching polysilicon material preferentially over silicon oxide. The process is anisotropic and employs a moderate to low pressure of Freon 11 (CFCl.sub.3) in an RF plasma discharge. In a second embodiment helium is mixed with the Freon 11 to inhibit degradation of the photoresist mask.
REFERENCES:
patent: Re30505 (1981-02-01), Jacob
patent: 3654108 (1972-04-01), Smith, Jr.
patent: 3806365 (1974-04-01), Jacob
patent: 3880684 (1975-04-01), Abe
patent: 3940506 (1976-02-01), Heinecke
patent: 3951709 (1976-04-01), Jacob
patent: 3951843 (1976-04-01), Jacob
patent: 3975252 (1976-08-01), Fraser et al.
patent: 3984301 (1976-10-01), Matsuzaki et al.
patent: 4028155 (1977-06-01), Jacob
patent: 4066037 (1978-01-01), Jacob
patent: 4069096 (1978-01-01), Reinberg et al.
patent: 4073669 (1978-02-01), Heinecke et al.
patent: 4094732 (1978-06-01), Reinberg
patent: 4123564 (1978-10-01), Ajima
patent: 4123663 (1978-10-01), Horiike
patent: 4148705 (1979-04-01), Battey et al.
patent: 4162185 (1979-07-01), Coburn et al.
patent: 4162210 (1979-07-01), Deppe
patent: 4180432 (1979-12-01), Clark
patent: 4182646 (1980-01-01), Zajac
patent: 4188426 (1980-02-01), Auerbach
patent: 4190488 (1980-02-01), Winters
patent: 4203800 (1980-05-01), Kitcher et al.
patent: 4209356 (1980-06-01), Stein
patent: 4213818 (1980-07-01), Lemons et al.
patent: 4214946 (1980-07-01), Forget et al.
patent: 4229247 (1980-10-01), Chiu et al.
patent: 4233109 (1980-11-01), Nishizawa
patent: 4253907 (1981-03-01), Parry et al.
patent: 4255230 (1981-03-01), Zajac
patent: 4298443 (1981-11-01), Maydan
Japan. J. Appl. Phys. Suppl. 2, Pt. 1, 1974, RF Sputter-Etching by Fluoro-Chloro-Hydrocarbon Gases by Hosokawa et al., pp. 435-438.
LFE Corporation, Plasma Systems, Bulletin 8277-PB1 dated Feb. 1979.
LFE Corporation
Powell William A.
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